Citation/Abstract

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An experimental study of the optical properties of thin silver(x) aluminum(1-x) films by surface plasma excitation
by Yang, Henglong, M.S., University of Massachusetts Lowell, 1994, 70 pages; AAT 1357083

Abstract (Summary)

The optical constants (n,k) of pure aluminum, silver, and aluminum/silver bilayer films with different thickness combinations (200 A total) were determined by the attenuated total reflection (ATR) method using the Kretschmann configuration. The simplex method was used for data fitting. The extinction coefficients k of pure aluminum and silver films are around 6 and 4 respectively, which are close to the bulk values.

The graph of k versus the thickness of the aluminum layer exhibits a minimum value of approximately 2 for the double-layer sample with 120 A of aluminum and 80 A silver. Whereas, the graph of the index of refraction n versus the thickness of the aluminum layer does not exhibit such behavior for the bilayer films.

Indexing (document details)

Advisor:Wong, Chuen, Karakashian, Aram S.
School:University of Massachusetts Lowell
School Location:United States -- Massachusetts
Source:MAI 32/05, p. 1408, Oct 1994
Source type:Dissertation
Subjects:Optics
Publication Number: AAT 1357083
Document URL:http://proquest.umi.com/pqdweb?did=748068051&sid=4&Fmt=2&cli entId=808&RQT=309&VName=PQD
ProQuest document ID:748068051


 

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