Citation/Abstract

The optical constants of thin silver and aluminum alloy films were determined at 6328 A by exciting a surface plasma wave (SPW) on the surface of the thin films using the attenuated total reflection technique (ATR). The thin films were prepared by the flash evaporation method under high vacuum. They were then heat treated or annealed for several hours. The reflectivity was measured varying the incident angle. The theoretical reflectivity for two and three interface systems were then fitted to the experimental reflectivity by least square fitting each of three parameters, n, k and t. It is found that the optical constants of Ag-Al alloy films change with percent concentration and are sensitive to the heat treatment of the films.