Citation/Abstract

Magneto-optical methods of vector magnetometry and ellipsometry were developed to study magnetic thin film structures consisting of one or two magnetic layers and several nonmagnetic layers. The method of Generalized Magneto-Optical Ellipsometry was developed to determine both the magnetization vector of the magnetic layer, and the optical and magneto-optical constants. High-resolution DC vector hysteresis loop measurements were made of Co thin films using the method. The technique was able to determine both the magnitude and direction of M throughout the reversal of the magnetization. The method was also used to examine the ripple-state of a NiFe thin film. By making such measurements at multiple angles of incidence, the thickness and optical constant of a non-magnetic overlayer on a magnetic layer were determined, with reasonable accuracy. Measurements at multiple angles of incidence also allowed the resolution of the individual layer magnetizations in a magnetic bilayer structure. By changing the angle of incidence, the magneto-optical sensitivity to each layer changed dramatically, enabling discrimination of the signal from each layer. Both the magnitude and direction of the magnetization of each layer was determined throughout a hysteresis cycle.